HAST高压老化试验箱

产品说明

HAST高压加速老化试验的目的是提高环境应力(如：温度)与工作应力(施加给产品的电压、负荷.等)，加快试验过程，缩短产品或系统的寿命试验时间。

用于调查分析何时出现电子元器件，和机械零件的摩耗和使用寿命的问题，使用寿命的故障分布函数呈什么样的形状，以及分析失效率上升的原因所进行的试验。

随着半导体可靠性的提高，目前大多半导体器件能承受长期的THB试验而不会产生失效，因此用来确定成品质量的测试时间也相应增加了许多。

为了提高试验效率、减少试验时间，采用了压力蒸煮锅试验方法。压力蒸煮锅试验方法主要分成两种类型：即PCT和USPCT(HAST) 现在压力蒸煮锅试验作为湿热加速试验被IEC(国际电工委员会)所标准化。

The purpose of HAST (High-Accelerated Stress Test) is to enhance environmental stress (e.g., temperature) and operational stress (such as voltage or load applied to the product), thereby accelerating the testing process and reducing the lifespan testing time for products or systems.

The test is to investigate and analyze the wear and service life of electronic components and mechanical parts, the shape of the failure distribution function of service life, and the reasons of the failure rate rising.

With the improvement of reliability of semiconductor, most of the semiconductor devices can withstand the long-term THB test without failure, so the test time for determining the quality of finished products has increased correspondingly.

To enhance test efficiency and reduce testing time, the autoclave test method was adopted. The autoclave test method is primarily divided into two types: PCT and USPCT (HAST). Currently, the autoclave test has been standardized by IEC (International Electrotechnical Commission) as a wet heat accelerated test.

技术参数